Rodenburg, John, Professor

Professor John Rodenburg

FRS, PhD, BSc

School of Electrical and Electronic Engineering

Emeritus Professor

Professor of Computational Microscopy

Former Faculty Director of Ion and Electron Microscopy

Imaging: Ptychography Lensless X-ray Electron Light Research Group

Semiconductor Materials and Devices Research Group

j.m.rodenburg@sheffield.ac.uk

Full contact details

Professor John Rodenburg
School of Electrical and Electronic Engineering

Profile

I studied Physics as an undergraduate at the University of Exeter and then did my PhD in the Cavendish Laboratory, University of Cambridge, where later I held a Royal Society University Research Fellowship.

I was also a Fellow of Murry Edwards College (formerly New Hall), where I taught physics and mathematics.

After a brief excursion from academic life to set up my first company, I moved to 91ֱ�� Hallam University to take up the Chair of Materials Analysis in the Materials and Engineering Research Institute (MERI). I moved to the EEE Department in University of 91ֱ�� in 2003.

My research career started with instrument development to record coherent electron diffraction patterns. Results from this led me to have an idea about how to improve transmission microscopes for atomic imaging by using an inverse computational method, now referred to as ‘ptychography’.

My original formulation of ptychography proved to be rather harder to do experimentally than I expected, and so I gave up on it at the end of the 1990s. However, I returned to it afresh in the 2000s, developing a completely new iterative solution to the phase problem.

Ptychography has since become a standard technique in X-ray microscopy, and has made substantial impact in EUV, electron and visible-light microscopy.

I continue to develop various forms of it. I set up a second company () in 2006, working for it part time as Chief Scientific Officer until 2015.

Qualifications

Fellow of the Royal Society
Chartered Physicist
PhD in Physics (University of Cambridge)
BSc in Physics with Electronics (University of Exeter)

Research interests

The theory and modelling of inverse computational imaging strategies
Diffractive imaging, specifically ptychography
Experimental X-ray, electron and visible-light ptychography
Electron microscopy and associated spectroscopies
Development of experimental configurations in X-ray microscopy
Instrument and detector development in electron microscopy
Applications of electron microscopy to materials science

Publications

Journal articles

Li P, Batey D & Rodenburg J (2019) . Ultramicroscopy.
Claus D & Rodenburg JM (2018) . Journal of the Optical Society of America A, 36(2), A12-A19.
Rodenburg J (2018) . Nature, 559(7714), 334-335.
Cao S, Maiden A & Rodenburg JM (2018) . Ultramicroscopy, 187, 71-83.
Cao S, Kok P, Li P, Maiden AM & Rodenburg JM (2016) . Physical Review A, 94.
Li P, Edo T, Batey D, Rodenburg J & Maiden A (2016) . Optics Express, 24(8), 9038-9038.
Li P, Batey DJ, Edo TB, Parsons AD, Rau C & Rodenburg JM (2016) . Journal of Optics, 18(5).
Li P, Batey DJ, Edo TB & Rodenburg JM (2015) . Ultramicroscopy, 158, 1-7.
Claus D & Rodenburg JM (2015) . Applied Optics, 54(8), 1936-1936.
Wang L, Liu C & Rodenburg JM (2015) . Microscopy, 64(2), 105-110.
Li P, Edo TB & Rodenburg JM (2014) . Ultramicroscopy, 147, 106-113.
Godden TM, Suman R, Humphry MJ, Rodenburg JM & Maiden AM (2014) . Optics Express, 22(10), 12513-12523.
Batey DJ, Edo TB, Rau C, Wagner U, Pesic ZD, Waigh TA & Rodenburg JM (2014) . PHYSICAL REVIEW A, 89(4).
Berenguer F, Bean RJ, Bozec L, Vila-Comamala J, Zhang F, Kewish CM, Bunk O, Rodenburg JM & Robinson IK (2014) . Biophys J, 106(2), 459-466.
Claus D & Rodenburg JM (2014) , 689-694.
Batey DJ, Claus D & Rodenburg JM (2014) . Ultramicroscopy, 138, 13-21.
Zhang F, Peterson I, Vila-Comamala J, Diaz A, Berenguer F, Bean R, Chen B, Menzel A, Robinson IK & Rodenburg JM (2013) . Opt Express, 21(11), 13592-13606.
Edo TB, Batey DJ, Maiden AM, Rau C, Wagner U, Pešić ZD, Waigh TA & Rodenburg JM (2013) . Physical Review A - Atomic, Molecular, and Optical Physics, 87(5).
Maiden AM, Morrison GR, Kaulich B, Gianoncelli A & Rodenburg JM (2013) . Nat Commun, 4, 1669.
Claus D, Robinson DJ, Chetwynd DG, Shuo Y, Pike WT, De J Toriz Garcia JJ & Rodenburg JM (2013) . Journal of Optics (United Kingdom), 15(3).
Claus D, Iliescu D & Rodenburg JM (2013) . Appl Opt, 52(1), A326-A335.
Godard P, Allain M, Chamard V & Rodenburg J (2012) . Optics Express, 20(23), 25914-25914.
Maiden AM, Humphry MJ, Sarahan MC, Kraus B & Rodenburg JM (2012) . Ultramicroscopy, 120, 64-72.
Claus D, Maiden AM, Zhang F, Sweeney FGR, Humphry MJ, Schluesener H & Rodenburg JM (2012) . Opt Express, 20(9), 9911-9918.
Humphry MJ, Kraus B, Hurst AC, Maiden AM & Rodenburg JM (2012) . Nat Commun, 3, 730.
Sarahan MC, Kraus B, Humphry MJ, Maiden AM & Rodenburg JM (2012) . Microscopy and Microanalysis, 18(S2), 502-503.
Rodenburg JM, Maiden A, Humphry M, Kraus B & Sarahan M (2012) . Microscopy and Microanalysis, 18(S2), 1024-1025.
Maiden AM, Humphry MJ & Rodenburg JM (2012) . Journal of the Optical Society of America A: Optics and Image Science, and Vision, 29(8), 1606-1614.
Claus D, Schluesener H, Maiden A, Zhang F, Sweeney F, Humphry M & Rodenburg J (2011) . Tenth International Conference on Correlation Optics.
Chen B, Zhang F, Berenguer F, Bean RJ, Kewish CM, Vila-Comamala J, Chu YS, Rodenburg JM & Robinson IK (2011) . NEW JOURNAL OF PHYSICS, 13.
Rodenburg J, Maiden A, Batey D, Sweeney F, Edo T, Hurst A, Hüe F, Midgley P, Wang P, Kirkland A & Humphry M (2011) . Microscopy and Microanalysis, 17(S2), 1058-1059.
Shenfield A & Rodenburg JM (2011) . J APPL PHYS, 109(12).
Maiden AM, Humphry MJ, Zhang F & Rodenburg JM (2011) . J Opt Soc Am A Opt Image Sci Vis, 28(4), 604-612.
Hüe F, Rodenburg JM, Maiden AM & Midgley PA (2011) . Ultramicroscopy, 111(8), 1117-1123.
Claus D, Watson J & Rodenburg J (2011) . Applied Optics, 50(34), H220-H220.
Claus D, Maiden AM, Zhang F, Hurst A, Edo T, Sweeney F, Rodenburg JM, Schluesener H & Humphry MJ (2011) . Proceedings of SPIE - The International Society for Optical Engineering, 8001.
Hue F, Rodenburg JM, Maiden AM, Sweeney F & Midgley PA (2010) . PHYS REV B, 82(12).
Zhang FC & Rodenburg JM (2010) . PHYS REV B, 82(12).
Maiden AM, Rodenburg JM & Humphry MJ (2010) . Opt Lett, 35(15), 2585-2587.
Hüe F, Maiden AM, Rodenburg JM & Midgley PA (2010) . Microscopy and Microanalysis, 16(S2), 748-749.
Rodenburg C, Liu X, Jepson MAE, Zhou Z, Rainforth WM & Rodenburg JM (2010) . Ultramicroscopy, 110(9), 1178-1184.
Zhang F & Rodenburg JM (2010) . AIP Conference Proceedings, 1365, 223-226.
Hurst AC, Edo TB, Walther T, Sweeney F & Rodenburg JM (2010) . Journal of Physics: Conference Series, 241.
Edo TB, Sweeney F, Lui C & Rodenburg JM (2010) . Journal of Physics: Conference Series, 241.
Atkinson KM, Sweeney F & Rodenburg JM (2010) . Journal of Physics: Conference Series, 241.
Rodenburg JM, Hurst AC & Maiden A (2010) . Journal of Physics: Conference Series, 241.
Edo TB, Zhang F & Rodenburg JM (2010) . Proceedings of SPIE - The International Society for Optical Engineering, 7729.
Maiden AM, Rodenburg JM & Humphry MJ (2010) . Proceedings of SPIE - The International Society for Optical Engineering, 7729.
Maiden AM & Rodenburg JM (2009) . Ultramicroscopy, 109(10), 1256-1262.
Liu C, Walther T & Rodenburg JM (2009) . Ultramicroscopy, 109(10), 1263-1275.
Dapor M, Inkson BJ, Rodenburg C & Rodenburg JM (2008) . EPL-EUROPHYS LETT, 82(3).
Rodenburg JM (2008) . Journal of Physics: Conference Series, 126.
Hurst AC & Rodenburg JM (2008) . Journal of Physics: Conference Series, 126.
Rodenburg JM (2008) . ADV IMAG ELECT PHYS, 150, 87-184.
Rodenburg JM, Hurst AC & Cullis AG (2007) . Ultramicroscopy, 107(2-3), 227-231.
Rodenburg JM, Hurst AC, Cullis AG, Dobson BR, Pfeiffer F, Bunk O, David C, Jefimovs K & Johnson I (2007) . Phys Rev Lett, 98(3), 034801.
Faulkner HML & Rodenburg JM (2005) . Ultramicroscopy, 103(2), 153-164.
Rodenburg JM & Faulkner HML (2004) . APPL PHYS LETT, 85(20), 4795-4797.
Faulkner HML & Rodenburg JM (2004) . Phys Rev Lett, 93(2), 023903.
Macak EB & Rodenburg JM (2004) . J VAC SCI TECHNOL A, 22(4), 1195-1199.
Wang HM, Simmonds MC, Huang YZ & Rodenburg JM (2003) . CHEM MATER, 15(18), 3474-3480.
Macak EB, Munz WD & Rodenburg JM (2003) . J APPL PHYS, 94(5), 2829-2836.
Macak EB, Munz WD & Rodenburg JM (2003) . J APPL PHYS, 94(5), 2837-2844.
Macak EB, Munz WD & Rodenburg JM (2003) . SURF ENG, 19(4), 310-314.
Wang HM, Simmonds MC & Rodenburg JM (2003) Manufacturing of YbAG coatings and crystallisation of the pure and Li2O-doped Yb2O3-A1(2)O(3) system by a modified sol-gel method. MATER CHEM PHYS, 77(3), 802-807.
Rodenburg JM (2001) . Ultramicroscopy, 87(3), 105-121.
Chen L, Simmonds MC, Habesch S & Rodenburg JM (2001) Crystal orientation effects on sputtering and depth resolution in GDOES. SURF INTERFACE ANAL, 31(3), 206-211.
Rodenburg J (1999) . Physics World, 12(2), 60-60.
Nellist PD & Rodenburg JM (1998) Electron ptychography. I. Experimental demonstration beyond the conventional resolution limits. ACTA CRYSTALLOGR A, 54, 49-60.
Plamann T & Rodenburg JM (1998) Electron ptychography. II. Theory of three-dimensional propagation effects. ACTA CRYSTALLOGR A, 54, 61-73.
McCallum BC, Landauer MN & Rodenburg JM (1996) Complex image reconstruction of weak specimens from a three-sector detector in the STEM (vol 101, pg 53, 1995). OPTIK, 103(3), 131-132.
McCallum BC, Landauer MN & Rodenburg JM (1996) Complex image reconstruction of weak specimens from a three-sector detector in the STEM: Correction. Optik (Jena), 103(3), 131-132.
LANDAUER MN, MCCALLUM BC & RODENBURG JM (1995) DOUBLE RESOLUTION IMAGING OF WEAK PHASE SPECIMENS WITH QUADRANT DETECTORS IN THE STEM. OPTIK, 100(1), 37-46.
NELLIST PD, MCCALLUM BC & RODENBURG JM (1995) RESOLUTION BEYOND THE INFORMATION LIMIT IN TRANSMISSION ELECTRON-MICROSCOPY. NATURE, 374(6523), 630-632.
NELLIST PD & RODENBURG JM (1994) BEYOND THE CONVENTIONAL INFORMATION LIMIT - THE RELEVANT COHERENCE FUNCTION. ULTRAMICROSCOPY, 54(1), 61-74.
PLAMANN T & RODENBURG JM (1994) DOUBLE RESOLUTION IMAGING WITH INFINITE DEPTH OF FOCUS IN SINGLE LENS SCANNING MICROSCOPY. OPTIK, 96(1), 31-36.
MCCALLUM BC & RODENBURG JM (1993) ERROR ANALYSIS OF CRYSTALLINE PTYCHOGRAPHY IN THE STEM MODE. ULTRAMICROSCOPY, 52(1), 85-99.
RODENBURG JM, MCCALLUM BC & NELLIST PD (1993) EXPERIMENTAL TESTS ON DOUBLE-RESOLUTION COHERENT IMAGING VIA STEM. ULTRAMICROSCOPY, 48(3), 304-314.
MCGIBBON AJ, BROWN LM, BLELOCH AL, BROWNING ND, AIRES FCS, FALLON PJ, GASKELL PH, GILKES KWR, HANSEN PL, HOWIE A , MAYNARD AD et al (1993) MICROSCOPY IN SOLID-STATE SCIENCE. MICROSC RES TECHNIQ, 24(4), 299-315.
MCCALLUM BC & RODENBURG JM (1993) SIMULTANEOUS RECONSTRUCTION OF OBJECT AND APERTURE FUNCTIONS FROM MULTIPLE FAR-FIELD INTENSITY MEASUREMENTS. J OPT SOC AM A, 10(2), 231-239.
MCCALLUM BC & RODENBURG JM (1992) 2-DIMENSIONAL DEMONSTRATION OF WIGNER PHASE-RETRIEVAL MICROSCOPY IN THE STEM CONFIGURATION. ULTRAMICROSCOPY, 45(3-4), 371-380.
RODENBURG JM & BATES RHT (1992) THE THEORY OF SUPERRESOLUTION ELECTRON-MICROSCOPY VIA WIGNER-DISTRIBUTION DECONVOLUTION. PHILOS T ROY SOC A, 339(1655), 521-553.
FRIEDMAN SL & RODENBURG JM (1992) OPTICAL DEMONSTRATION OF A NEW PRINCIPLE OF FAR-FIELD MICROSCOPY. J PHYS D APPL PHYS, 25(2), 147-154.
Rodenburg JM (1992) . Micron And Microscopica Acta, 23(1-2), 213-214.
MCMULLAN D, RODENBURG JM, MUROOKA Y & MCGIBBON AJ (1990) PARALLEL EELS CCD DETECTOR FOR A VG HB501 STEM. INST PHYS CONF SER(98), 55-58.
BATES RHT & RODENBURG JM (1989) SUB-ANGSTROM TRANSMISSION MICROSCOPY - A FOURIER-TRANSFORM ALGORITHM FOR MICRODIFFRACTION PLANE INTENSITY INFORMATION. ULTRAMICROSCOPY, 31(3), 303-308.
RODENBURG JM (1989) THE PHASE PROBLEM, MICRODIFFRACTION AND WAVELENGTH-LIMITED RESOLUTION - A DISCUSSION. ULTRAMICROSCOPY, 27(4), 413-422.
RODENBURG JM (1988) PROPERTIES OF ELECTRON MICRODIFFRACTION PATTERNS FROM AMORPHOUS MATERIALS. ULTRAMICROSCOPY, 25(4), 329-343.
HOWIE A, MCGILL CA & RODENBURG JM (1985) INTENSITY CORRELATIONS IN MICRODIFFRACTION FROM AMORPHOUS MATERIALS. J PHYS-PARIS, 46(C-9), 59-62.
RODENBURG JM (1985) MEASUREMENT OF AN ATOMIC POSITION COHERENCE LENGTH IN A-GE. J PHYS-PARIS, 46(C-9), 63-68.
RODENBURG JM & MCMULLAN D (1985) THE RECORDING OF MICRODIFFRACTION PATTERNS IN SCANNING-TRANSMISSION ELECTRON-MICROSCOPY. J PHYS E SCI INSTRUM, 18(11), 949-953.
RODENBURG JM & MCMULLAN D (1983) A HIGH-RESOLUTION MICRODIFFRACTION CAMERA FOR STEM. INST PHYS CONF SER(68), 511-514.

Chapters

Rodenburg J & Maiden A (2019) , Springer Handbook of Microscopy (pp. 819-904). Springer International Publishing
Cao S, Li P, Maiden A & Rodenburg J () (pp. 475-476). Wiley-VCH Verlag GmbH & Co. KGaA
Hurst A, Zhang F & Rodenburg JM () , EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 701-702). Springer Berlin Heidelberg

Conference proceedings papers

Rodenburg JM, Cao S & Maiden AM (2016) OPTICAL ARRANGEMENTS FOR PHASE-SENSITIVE IMAGING USING ELECTRON PTYCHOGRAPHY. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 60-61)
Rodenburg JM (2014) . Classical Optics 2014, 2014.
Claus D, Iliescu D, Watson J & Rodenburg J (2012) . Biomedical Optics and 3-D Imaging, 2012.
Rodenburg JM (2012) . SHORT-WAVELENGTH IMAGING AND SPECTROSCOPY SOURCES, Vol. 8678
Claus D, Robinson DJ, Chetwynd DG, Shuo Y, Pike WT & Rodenburg JM (2012) . SPECKLE 2012: V INTERNATIONAL CONFERENCE ON SPECKLE METROLOGY, Vol. 8413
Rodenburg JM, Maiden AM & Humphry MJ (2010) TRANSMISSION AND REFLECTION MICROSCOPY WITHOUT LENSES. RECENT TRENDS IN CHARGED PARTICLE OPTICS AND SURFACE PHYSICS INSTRUMENTATION (pp 61-62)
Walther T, Atkinson K, Sweeney F & Rodenburg JM (2008) . EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 165-166). Berlin, 1 September 2008 - 5 September 2008.
Liu C, Walther T & Rodenburg JM (2008) . EMC2008- 14th European Microscopy Congress, Vol. 1 (Instrumentation and Methods) (pp 723-724). Berlin, 1 September 2008 - 5 September 2008.
Atkinson KM, Sweeney F & Rodenburg JM (2008) STEM probe characteristics at large defoci for use in ptychographical imaging. - art. no. 012092. EMAG: ELECTRON MICROSCOPY AND ANALYSIS GROUP CONFERENCE 2007, Vol. 126 (pp 12092-12092)
Fielden IM & Rodenburg JM (2004) A technique for real-time, in situ SEM observation of grain growth at elevated temperatures. RECRYSTALLIZATION AND GRAIN GROWTH, PTS 1 AND 2, Vol. 467-470 (pp 1385-1388)
Xu H, Akid R, Brumpton G, Wang H & Rodenburg JM (2004) Electrochemical and AFM/SEM studies of Ni-Cr electroplated and sol-gel coated samples. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 417-420)
Fielden IM, Cawley J & Rodenburg JM (2004) Backscattered SEM imaging of high-temperature samples for grain growth studies in metals. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 181-184)
Rodenburg JM (2004) Can Ronchigrams provide a route to sub-angstrom tomographic reconstruction?. ELECTRON MICROSCOPY AND ANALYSIS 2003(179) (pp 185-190)
Meidia H, Cullis AG, Schonjahn C, Munz WD & Rodenburg JM (2002) Investigation of intermixing in TiAlN/VN nanoscale multilayer coatings by energy-filtered TEM. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 209-213)
Macak EB, Munz WD & Rodenburg JM (2002) Electron microscopy studies of hard coatings deposited on sharp edges by combined cathodic arc/unbalanced magnetron PVD. SURFACE & COATINGS TECHNOLOGY, Vol. 151 (pp 349-354)
Rodenburg JM (2001) Time- and space-dependent image contrast mechanisms in environmental scanning electron microscopy (ESEM). ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 73-76)
Macak EB, Munz WD & Rodenburg JM (2001) Quantitative EDX-analysis of PVD hard coatings deposited on sharp edges. ELECTRON MICROSCOPY AND ANALYSIS 2001(168) (pp 345-348)
Rodenburg JM (1999) Measurement of higher-order correlation functions in amorphous materials via coherent microdiffraction. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 145-148)
Rodenburg JM & Lupini AR (1999) Measuring lens parameters from coherent Ronchigrams in STEM. ELECTRON MICROSCOPY AND ANALYSIS 1999(161) (pp 339-342)
James EM & Rodenburg JM (1997) A method for measuring the effective source coherence in a field emission transmission electron microscope. APPLIED SURFACE SCIENCE, Vol. 111 (pp 174-179)
James EM, Bleloch AL & Rodenburg JM (1997) A novel ultra-sharp field emission electron source demonstrated in a STEM. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 65-68)
Colman CP & Rodenburg JM (1997) Super-resolution STEM imaging of crystals with large unit cells. ELECTRON MICROSCOPY AND ANALYSIS 1997(153) (pp 117-120)
James EM, McCallum BC & Rodenburg JM (1995) Measurement and improvement of the effective source coherence in STEM. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 277-280)
Landauer MN & Rodenburg JM (1995) Experimental tests of double-resolution imaging with quadrant detectors in the STEM. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 281-284)
Colman CP & Rodenburg JM (1995) Super-resolution STEM imaging in the presence of specimen drift. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 107-110)
Plamann T & Rodenburg JM (1995) Ptychographical imaging of sphalerite structures. ELECTRON MICROSCOPY AND ANALYSIS 1995, Vol. 147 (pp 117-120)
MCCALLUM BC, RODENBURG JM & NELLIST PD (1994) Direct measurement of the effective source coherence in STEM. ELECTRON MICROSCOPY 1994, VOL 1 (pp 209-210)
NELLIST PD, MCCALLUM BC & RODENBURG JM (1994) STEM imaging of <110> tetrahedral semiconductors. ELECTRON MICROSCOPY 1994, VOL 1 (pp 489-490)
PLAMANN T & RODENBURG JM (1994) Simulations on super-resolution imaging of perfect crystals. ELECTRON MICROSCOPY 1994, VOL 1 (pp 939-940)
LANDAUER MN & RODENBURG JM (1994) Double-resolution imaging with quadrant detectors in STEM. ELECTRON MICROSCOPY 1994, VOL 1 (pp 155-156)
KAWASAKI T & RODENBURG JM (1993) DECONVOLVING LENS TRANSFER-FUNCTIONS IN ELECTRON HOLOGRAMS. ULTRAMICROSCOPY, Vol. 52(3-4) (pp 248-252)
NELLIST PD & RODENBURG JM (1993) IMAGE-RESOLUTION IMPROVEMENT USING COHERENT MICRODIFFRACTION IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 239-242)
PLAMANN T & RODENBURG JM (1993) THICKNESS LIMITATIONS OF ABERRATION-FREE PROJECTION IMAGING. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 243-246)
LANDAUER MN & RODENBURG JM (1993) DIRECT COMPLEX TRANSFER-FUNCTION RECONSTRUCTION BY PROCESSING OF NEAR-FOCUS SHADOW IMAGES IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 251-254)
AITCHISON PR, RODENBURG JM & BROWN LM (1993) INFORMATION IN RONCHIGRAMS OF A SUPERLATTICE FROM DEFOCUSED MICRODIFFRACTION IN STEM. ELECTRON MICROSCOPY AND ANALYSIS 1993(138) (pp 167-170)
AITCHISON PR & RODENBURG JM (1991) MICRODIFFRACTION MEASUREMENTS OF STRAIN IN A STEM. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 409-412)
FRIEDMAN SL, RODENBURG JM & MCCALLUM BC (1991) PHASE RECONSTRUCTION IMAGING IN SCANNING-TRANSMISSION MICROSCOPY VIA THE MICRODIFFRACTION PLANE. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 491-494)
AKROBOTU KH & RODENBURG JM (1991) APERTURE FRINGE EFFECTS IN COHERENT CBED PATTERNS. ELECTRON MICROSCOPY AND ANALYSIS 1991, Vol. 119 (pp 395-396)
RODENBURG JM & RAUF IA (1990) A CROSS-CORRELATION MEASURE OF ORDER IN AMORPHOUS INDIUM OXIDE. EMAG-MICRO 89, VOLS 1 AND 2, Vol. 98 (pp 119-122)
MUROOKA Y, RODENBURG JM & WALLS MG (1990) HIGH-RESOLUTION TIME RESOLVED EELS AND CACO3. TRANSACTIONS OF THE ROYAL MICROSCOPICAL SOCIETY : NEW SERIES, VOL 1, Vol. 1 (pp 185-188)
RODENBURG JM (1990) HIGHER SPATIAL-RESOLUTION VIA SIGNAL-PROCESSING OF THE MICRODIFFRACTION PLANE. EMAG-MICRO 89, VOLS 1 AND 2, Vol. 98 (pp 103-106)
BROWN LM, RODENBURG JM & PIKE WT (1988) MICRODIFFRACTION. EUREM 88, VOLS 1-3, Vol. 93 (pp 3-8)

Grants

Dates	Sponsor	Grant Title	PI/co-I
Sept 11 - Feb 17	EPSRC	Phase modulation technology for X-ray imaging	Co-I

Teaching activities

EEE6226, Future trends in Electronic and Electrical Engineering

Professional activities and memberships

Faculty Director of Ion and Electron Microscopy

Research students

Student	Degree	Status	Primary/Secondary
Atkinson K M	PhD	Graduated	Primary
Batey D	PhD	Graduated	Primary
Cao S	PhD	Graduated	Primary
Edo T B	PhD	Graduated	Primary
Li P	PhD	Graduated	Primary

91ֱ��

School of Electrical and Electronic Engineering

School of Electrical and Electronic Engineering

Professor John Rodenburg

Journal articles

Chapters

Conference proceedings papers

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