@inproceedings{inproceedings, title  = {{Backscattered SEM imaging of high-temperature samples for grain growth studies in metals}},

 url = {{}},

 year = {{2004}},

 month = {{1}},

 author = {{Fielden IM and Cawley J and Rodenburg JM}},

 journal = {{ELECTRON MICROSCOPY AND ANALYSIS 2003}},

 issue = {{179}},

 pages = {{181-184}},

 note = {{Accessed on 2024/12/22}}}