@inproceedings{inproceedings, title  = {{Super-resolution STEM imaging in the presence of specimen drift}},

 url = {{}},

 year = {{1995}},

 month = {{1}},

 author = {{Colman CP and Rodenburg JM}},

 volume = {{147}},

 journal = {{ELECTRON MICROSCOPY AND ANALYSIS 1995}},

 pages = {{107-110}},

 note = {{Accessed on 2024/12/22}}}