TY - CONF T1 - Sensitivity of lumped parameter battery models to constituent parallel-RC element parameterisation error JO - IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society PY - 2014/01/01 AU - Nejad S AU - Gladwin DT AU - Stone DA ED - DO - DOI: 10.1109/iecon.2014.7049367 PB - IEEE Y2 - 2025/04/11 ER -