TY  - JOUR

T1  - Measuring Non-Destructively the Total Indium Content and Its Lateral Distribution in Very Thin Single Layers or Quantum Dots Deposited onto Gallium Arsenide Substrates Using Energy-Dispersive X-Ray Spectroscopy in a Scanning Electron Microscope

JO  - Nanomaterials

PY  - 2022/06/28

AU  - Walther T

ED  - 

DO  - DOI: 10.3390/nano12132220

PB  - MDPI AG

VL  - 12

IS  - 13

Y2  - 2024/12/22

ER  -