TY  - JOUR

T1  - Inhomogeneity of the deep center el2 in GaAs observed by direct infra-red imaging

JO  - Journal of Electronic Materials

PY  - 1984/01/01

AU  - Skolnickf MS

AU  - Brozel MR

AU  - Reed LJ

AU  - Grant I

AU  - Stirland DJ

AU  - Ware RM

ED  - 

DO  - DOI: 10.1007/bf02659839

PB  - Springer Science and Business Media LLC

VL  - 13

IS  - 1

SP  - 107

EP  - 125

Y2  - 2024/12/22

ER  -