TY - CONF T1 - Advances in electron channelling contrast imaging and electron backscatter diffraction for imaging and analysis of structural defects in the scanning electron microscope JO - IOP Conference Series: Materials Science and Engineering UR - https://eprints.whiterose.ac.uk/164366/ PY - 2020/08/05 AU - Trager-Cowan C AU - Alasmari A AU - Avis W AU - Bruckbauer J AU - Edwards PR AU - Hourahine B AU - Kraeusel S AU - Kusch G AU - Jablon BM AU - Johnston R AU - Martin RW et al ED - DO - DOI: 10.1088/1757-899x/891/1/012023 PB - IOP Publishing VL - 891 Y2 - 2025/04/22 ER -