TY  - CONF

T1  - A contribution to the quantitative comparison of experimental high-resolution electron micrographs and image simulations

JO  - MICROSCOPY OF SEMICONDUCTING MATERIALS 1995

PY  - 1995/01/01

AU  - Walther T

AU  - Hetherington CJD

AU  - Humphreys CJ

ED  - Cullis AG

ED  - StatonBevan AE

VL  - 146

SP  - 53

EP  - 56

Y2  - 2024/12/22

ER  -