TY  - JOUR

T1  - Bounded Reordering in the Distributed Test Architecture

JO  - IEEE Transactions on Reliability

UR  - http://eprints.whiterose.ac.uk/142295/

PY  - 2018/06/01

AU  - Hierons RM

AU  - Merayo MG

AU  - Nunez M

ED  - 

DO  - DOI: 10.1109/tr.2018.2800093

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 67

IS  - 2

SP  - 522

EP  - 537

Y2  - 2024/12/22

ER  -