TY  - JOUR

T1  - Improving test quality using robust unique input/output circuit sequences (UIOCs)

JO  - Information and Software Technology

PY  - 2006/01/01

AU  - Guo Q

AU  - Hierons RM

AU  - Harman M

AU  - Derderian K

ED  - 

DO  - DOI: 10.1016/j.infsof.2005.08.001

PB  - Elsevier BV

VL  - 48

IS  - 8

SP  - 696

EP  - 707

Y2  - 2024/12/22

ER  -