TY - JOUR T1 - Improving test quality using robust unique input/output circuit sequences (UIOCs) JO - Information and Software Technology PY - 2006/01/01 AU - Guo Q AU - Hierons RM AU - Harman M AU - Derderian K ED - DO - DOI: 10.1016/j.infsof.2005.08.001 PB - Elsevier BV VL - 48 IS - 8 SP - 696 EP - 707 Y2 - 2025/04/16 ER -