@inproceedings{inproceedings, title  = {{The limitations of pattern recognition and displacement measurement techniques for evaluating HREM images of strained semiconductor interfaces}},

 url = {{}},

 year = {{1995}},

 month = {{1}},

 author = {{Walther T and Humphreys CJ}},

 volume = {{147}},

 journal = {{ELECTRON MICROSCOPY AND ANALYSIS 1995}},

 pages = {{103-106}},

 note = {{Accessed on 2024/12/22}}}