TY  - JOUR

T1  - Temperature dependence of avalanche multiplication in submicron silicon devices

JO  - Proceedings of ESSDERC 2005: 35th European Solid-State Device Research Conference

PY  - 2005/01/01

AU  - Massey DJ

AU  - David JPR

AU  - Rees GJ

ED  - 

DO  - DOI: 10.1109/ESSDER.2005.1546631

VL  - 2005

SP  - 245

EP  - 248

Y2  - 2024/12/22

ER  -