TY  - CONF

T1  - Log-based slicing for system-level test cases

JO  - Proceedings of the 30th ACM SIGSOFT International Symposium on Software Testing and Analysis

PY  - 2021/07/11

AU  - Messaoudi S

AU  - Shin D

AU  - Panichella A

AU  - Bianculli D

AU  - Briand LC

ED  - 

DO  - DOI: 10.1145/3460319.3464824

PB  - ACM

Y2  - 2024/12/22

ER  -