TY  - CONF

T1  - Process improvement in the microelectronic industry by a state space modelling

JO  - QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL

PY  - 2005/08/01

AU  - Triantafyllopoulos K

AU  - Godolphin JD

AU  - Godolphin EJ

ED  - 

DO  - DOI: 10.1002/qre.734

VL  - 21

IS  - 5

SP  - 465

EP  - 475

Y2  - 2024/12/22

ER  -