TY  - JOUR

T1  - Relating the Experimental Ionization Coefficients in Semiconductors to the Nonlocal Ionization Coefficients

JO  - IEEE Transactions on Electron Devices

PY  - 2015/04/27

AU  - Jeng Shiuh Cheong

AU  - Hayat MM

AU  - Xinxin Zhou

AU  - David JPR

ED  - 

DO  - DOI: 10.1109/ted.2015.2422789

PB  - Institute of Electrical and Electronics Engineers (IEEE)

VL  - 62

IS  - 6

SP  - 1946

EP  - 1952

Y2  - 2024/10/17

ER  -