TY  - JOUR

T1  - Evaluation of dynamic avalanche performance in 1.2kV MOS-bipolar devices

JO  - IEEE Transactions on Electron Devices

UR  - http://eprints.whiterose.ac.uk/162876/

PY  - 2020/07/21

AU  - Luo P

AU  - Madathil S

AU  - Nishizawa S-I

AU  - Saito W

ED  - 

DO  - DOI: 10.1109/TED.2020.3007594

PB  - Institute of Electrical and Electronics Engineers

Y2  - 2024/10/18

ER  -