TY - JOUR T1 - Optimizing the length of checking sequences JO - IEEE Transactions on Computers PY - 2006/01/01 AU - Hierons RM AU - Ural H ED - DO - DOI: 10.1109/tc.2006.80 PB - Institute of Electrical and Electronics Engineers (IEEE) VL - 55 IS - 5 SP - 618 EP - 629 Y2 - 2025/04/17 ER -