TY  - JOUR

T1  - An effective zero-shot learning approach for intelligent fault detection using 1D CNN

JO  - Applied Intelligence

PY  - 2022/11/12

AU  - Wei H

ED  - 

DO  - DOI: 10.1007/s10489-022-04342-1

PB  - Springer

Y2  - 2024/10/18

ER  -