TY  - CONF

T1  - Scattering distribution from semiconductors as a function of angle and energy loss in the electron microscope

JO  - Materials Research Society Symposium - Proceedings

PY  - 1997/01/01

AU  - Boothroyd CB

AU  - Dunin-Borkowski RE

AU  - Walther T

ED  - 

VL  - 466

SP  - 113

EP  - 118

Y2  - 2024/12/22

ER  -