TY  - JOUR

T1  - Characterization of defects in Mg doped GaN epitaxial layers using conductance measurements

JO  - Thin Solid Films

PY  - 2012/01/01

AU  - Elsherif OS

AU  - Vernon-Parry KD

AU  - Dharmadasa IM

AU  - Evans-Freeman JH

AU  - Airey RJ

AU  - Kappers MJ

AU  - Humphreys CJ

ED  - 

DO  - DOI: 10.1016/j.tsf.2011.11.020

VL  - 520

IS  - 7

SP  - 3064

EP  - 3070

Y2  - 2024/12/22

ER  -