TY  - JOUR

T1  - Accurate measurement of atomic segregation to grain boundaries or to planar faults by analytical transmission electron microscopy

JO  - physica status solidi (c)

UR  - http://eprints.whiterose.ac.uk/86360/

PY  - 2015/02/27

AU  - Walther T

ED  - 

DO  - DOI: 10.1002/pssc.201400121

PB  - Wiley

VL  - 12

IS  - 3

SP  - 310

EP  - 313

Y2  - 2024/12/22

ER  -