TY - CONF T1 - VCSELs for 640- to 1100-nm emission JO - Fabrication, Testing, and Reliability of Semiconductor Lasers II PY - 1997/12/01 AU - Sale TE AU - Roberts JS AU - David JPR AU - Grey R AU - Robson PN ED - DO - DOI: 10.1117/12.273833 PB - SPIE Y2 - 2024/12/22 ER -