TY - CONF
T1 -
VCSELs for 640- to 1100-nm emission
JO - Fabrication, Testing, and Reliability of Semiconductor Lasers II
PY - 1997/12/01
AU - Sale TE
AU - Roberts JS
AU - David JPR
AU - Grey R
AU - Robson PN
ED -
DO - DOI: 10.1117/12.273833
PB - SPIE
Y2 - 2024/12/22
ER -