TY  - JOUR

T1  - X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of UV-exposed polystyrene

JO  - Macromolecular Chemistry and Physics

UR  - http://dx.doi.org/10.1002/macp.1995.021961122

PY  - 2003/03/12

AU  - France RM

AU  - O'Toole L

AU  - Short RD

AU  - Pollicino N

ED  - 

DO  - DOI: 10.1002/macp.1995.021961122

PB  - Wiley

VL  - 196

IS  - 11

SP  - 3695

EP  - 3705

Y2  - 2024/12/22

ER  -