@article{article, title  = {{X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis of UV-exposed polystyrene}},

 publisher = {{Wiley}},

 url = {{http://dx.doi.org/10.1002/macp.1995.021961122 }},

 year = {{2003}},

 month = {{3}},

 author = {{France RM and O'Toole L and Short RD and Pollicino N}},

 doi = {{10.1002/macp.1995.021961122}},

 volume = {{196}},

 journal = {{Macromolecular Chemistry and Physics}},

 issue = {{11}},

 pages = {{3695-3705}},

 note = {{Accessed on 2024/12/22}}}