TY  - JOUR

T1  - Arbitrary waveform power controller for thermal measurements of semiconductor devices

JO  - Electronics Letters

UR  - http://dx.doi.org/10.1049/el.2011.3927

PY  - 2012/03/29

AU  - Davidson JN

AU  - Stone DA

AU  - Foster MP

ED  - 

DO  - DOI: 10.1049/el.2011.3927

PB  - Institution of Engineering and Technology

VL  - 48

SP  - 400

EP  - 402

Y2  - 2024/10/18

ER  -