@inproceedings{inproceedings, title  = {{Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN}},

 publisher = {{Press Point}},

 url = {{}},

 year = {{2000}},

 month = {{1}},

 author = {{Pidun M and Karduck P and Mayer J and Heime K and Schineller B and Walther T}},

 pages = {{172-173}},

 note = {{Accessed on 2024/12/22}}}