@inproceedings{inproceedings, title  = {{Calibration of thickness-dependent k-factors of Germanium X-ray lines for improved analytical transmission electron microscopy of SiGe layers}},

 publisher = {{Royal Microscopical Society}},

 url = {{}},

 year = {{2012}},

 month = {{9}},

 author = {{Qiu Y and Norris DJ and Walther T}},

 isbn = {{978-0-9502463-6-9}},

 volume = {{2}},

 issue = {{Physical Sciences: Tools and Techniques}},

 pages = {{643-644}},

 note = {{Accessed on 2024/12/22}}}