TY  - JOUR

T1  - A Comparison of Early Stage Hot carrier Degradation behaviour in 5V & 3 V submicron Low Doped Drain Metal Oxide Semiconductor Field Effect Transistors

JO  - Microelectronics reliability

PY  - 2001/01/01

AU  - De Souza MM

AU  - Wang J

AU  - Manhas S

AU  - Oates AS

AU  - Sankara Narayanan EM

ED  - 

VL  - 42

IS  - 2

SP  - 169

Y2  - 2024/10/18

ER  -