@inproceedings{inproceedings, title  = {{A Theoretical Framework for Understanding Mutation-Based Testing Methods}},

 publisher = {{IEEE}},

 url = {{}},

 year = {{2016}},

 month = {{7}},

 author = {{Shin D and Bae D-H}},

 doi = {{10.1109/icst.2016.22}},

 journal = {{2016 IEEE International Conference on Software Testing, Verification and Validation (ICST)}},

 note = {{Accessed on 2024/12/22}}}