@article{article, title  = {{Imaging basal plane stacking faults and dislocations in (11-22) GaN using electron channelling contrast imaging}},

 publisher = {{AIP Publishing}},

 url = {{http://eprints.whiterose.ac.uk/159178/ }},

 year = {{2018}},

 month = {{8}},

 author = {{Naresh-Kumar G and Thomson D and Zhang Y and Bai J and Jiu L and Yu X and Gong YP and Smith RM and Wang T and Trager-Cowan C}},

 doi = {{10.1063/1.5042515}},

 volume = {{124}},

 journal = {{Journal of Applied Physics}},

 issue = {{6}},

 note = {{Accessed on 2024/12/22}}}