TY  - JOUR

T1  - Quantification of series of X-ray spectra taken at different tilts in analytical transmission electron microscopy

JO  - 17TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS 2011

PY  - 2011/01/01

AU  - Parri MC

AU  - Walther T

AU  - IOP

ED  - 

DO  - DOI: 10.1088/1742-6596/326/1/012037

VL  - 326

Y2  - 2024/12/22

ER  -