TY  - CONF

T1  - Test of a new analytical method to measure the composition of a planar fault

CY  - Onderstepoort

PY  - 2002/01/01

AU  - Walther T

AU  - Recnik A

AU  - Daneu N

ED  - Engelbrecht J

ED  - Witcomb M

ED  - Cross R

ED  - Richards P

PB  - Microscopy Society of Southern Africa

VL  - 1 (Physics and Materials)

SP  - 535

EP  - 536

Y2  - 2024/12/22

ER  -