TY  - CONF

T1  - Monte Carlo simulation of impact ionization effects in MSM photodetectors and MESFET's.

JO  - COMPOUND SEMICONDUCTORS 1996

PY  - 1997/01/01

AU  - Dunn GM

AU  - Rees GJ

AU  - David JPR

ED  - Shur MS

ED  - Suris RA

IS  - 155

SP  - 659

EP  - 662

Y2  - 2024/10/18

ER  -