TY  - CONF

T1  - Comparison of the silicon/phosphorus ratio in natural and synthetic nagelschmidtite for possible use as standard for microanalysis based on X-ray lines of Si and P

PY  - 2014/06/30

AU  - Walther T

ED  - Hozak P

PB  - Czechoslovak Microscopy Society

VL  - Instrumentation & Techniques (IT-5-P-3376)

SP  - 616

EP  - 617

Y2  - 2024/12/22

ER  -