TY - CONF
T1 - A comparison of avalanche breakdown probabilities in semiconductor materials
JO - JOURNAL OF MODERN OPTICS
PY - 2004/06/01
AU - Ng JS
AU - Tan CH
AU - David JPR
ED -
DO - DOI: 10.1080/09500340410001670848
VL - 51
IS - 9-10
SP - 1315
EP - 1321
Y2 - 2025/01/06
ER -