TY  - JOUR

T1  - Temperature dependence of impact ionization in GaAs

JO  - IEEE Transactions on Electron Devices

UR  - http://eprints.whiterose.ac.uk/897/

PY  - 2003/01/01

AU  - Groves C

AU  - Ghin R

AU  - David JPR

AU  - Rees GJ

ED  - 

DO  - DOI: 10.1109/TED.2003.816918

VL  - 50

IS  - 10

SP  - 2027

EP  - 2031

Y2  - 2024/12/22

ER  -