@article{article, title  = {{Auger depth profile analysis and EFTEM analysis of annealed Ti/Al-contacts on Si-doped GaN}},

 url = {{}},

 year = {{2001}},

 month = {{1}},

 author = {{Pidun M and Karduck P and Mayer J and Heime K and Schineller B and Walther T}},

 doi = {{10.1016/S0169-4332(01)00282-3}},

 volume = {{179}},

 journal = {{Applied Surface Science}},

 issue = {{1-4}},

 pages = {{213-221}},

 note = {{Accessed on 2024/12/22}}}