TY  - JOUR

T1  - Data BER analysis of OAM-assisted physical layer authentication system

JO  - IEICE Electronics Express

UR  - http://dx.doi.org/10.1587/elex.19.20220434

PY  - 2022/12/10

AU  - Hu T

AU  - Zhang B

AU  - Zhao K

AU  - Wang Y

AU  - Zhang J

ED  - 

DO  - DOI: 10.1587/elex.19.20220434

PB  - Institute of Electronics, Information and Communications Engineers (IEICE)

VL  - 19

IS  - 23

SP  - 20220434

EP  - 20220434

Y2  - 2024/10/18

ER  -