TY  - JOUR

T1  - Carrier Escape and the Ideality Factor in Quantum Dot p-n Junctions

JO  - IEEE JOURNAL OF QUANTUM ELECTRONICS

PY  - 2014/04/01

AU  - Spencer P

AU  - Clarke E

AU  - Murray R

ED  - 

DO  - DOI: 10.1109/JQE.2014.2303515

VL  - 50

IS  - 4

SP  - 213

EP  - 219

Y2  - 2024/12/22

ER  -