@article{article, title  = {{Electron energy-loss spectroscopic profiling of thin film structures: 0.39 nm line resolution and 0.04 eV precision measurement of near-edge structure shifts at interfaces}},

 url = {{}},

 year = {{2003}},

 month = {{1}},

 author = {{Walther T}},

 doi = {{10.1016/S0304-3991(03)00104-9}},

 volume = {{96}},

 journal = {{Ultramicroscopy}},

 issue = {{3-4}},

 pages = {{401-411}},

 note = {{Accessed on 2024/12/22}}}