TY  - JOUR

T1  - Developments in X-ray tomography characterization for electrochemical devices

JO  - Materials Today

UR  - http://dx.doi.org/10.1016/j.mattod.2019.05.019

PY  - 2019/12/01

AU  - Heenan TMM

AU  - Tan C

AU  - Hack J

AU  - Brett DJL

AU  - Shearing PR

ED  - 

DO  - DOI: 10.1016/j.mattod.2019.05.019

PB  - Elsevier BV

VL  - 31

SP  - 69

EP  - 85

Y2  - 2024/12/22

ER  -