TY  - CHAP

T1  - Application of a U-Net Convolutional Neural Network to Ultrasonic Wavefield Measurements for Defect Characterization

T2  - Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6

PY  - 2021/04/26

AU  - Eckels JD

AU  - Fernandez IF

AU  - Ho K

AU  - Dervilis N

AU  - Jacobson EM

AU  - Wachtor AJ

ED  - 

DO  - DOI: 10.1007/978-3-030-76335-0_18

PB  - Springer International Publishing

SP  - 167

EP  - 181

Y2  - 2024/12/22

ER  -