TY  - JOUR

T1  - Off-state operation of a three terminal ionic FET for logic-in-memory

JO  - IEEE Journal of the Electron Devices Society

UR  - http://eprints.whiterose.ac.uk/151647/

PY  - 2019/09/12

AU  - Song X

AU  - Kumar A

AU  - De Souza MM

ED  - 

DO  - DOI: 10.1109/jeds.2019.2941076

PB  - Institute of Electrical and Electronics Engineers (IEEE)

Y2  - 2024/10/18

ER  -