@article{article, title = {{Knowledge-Enhanced Spatiotemporal Analysis for Anomaly Detection in Process Manufacturing}}, publisher = {{Elsevier BV}}, url = {{http://dx.doi.org/10.1016/j.compind.2024.104111 }}, year = {{2024}}, month = {{10}}, author = {{Allen L and Lu H and Cordiner J}}, doi = {{10.1016/j.compind.2024.104111}}, volume = {{161}}, journal = {{Computers in Industry}}, pages = {{104111-104111}}, note = {{Accessed on 2024/12/22}}}