@article{article, title = {{Impact Ionization Coefficients in 4H-SiC by Ultralow Excess Noise Measurement}}, url = {{}}, year = {{2012}}, month = {{1}}, author = {{Green JE and Loh WS and Marshall ARJ and Ng BK and Tozer RC and David JPR and Soloviev SI and Sandvik PM}}, journal = {{IEEE Transactions on Electron Devices}}, note = {{Accessed on 2025/05/09}}}