@article{article, title  = {{Impact Ionization Coefficients in 4H-SiC by Ultralow Excess Noise Measurement}},

 url = {{}},

 year = {{2012}},

 month = {{1}},

 author = {{Green JE and Loh WS and Marshall ARJ and Ng BK and Tozer RC and David JPR and Soloviev SI and Sandvik PM}},

 journal = {{IEEE Transactions on Electron Devices}},

 note = {{Accessed on 2024/12/22}}}