@article{article, title = {{Impact ionization coefficients in 4H-SiC by ultralow excess noise measurement}},
url = {{}},
year = {{2012}},
month = {{4}},
author = {{Green JE and Loh WS and Marshall ARJ and Ng BK and Tozer RC and David JPR and Soloviev SI and Sandvik PM}},
doi = {{10.1109/TED.2012.2185499}},
volume = {{59}},
journal = {{IEEE Transactions on Electron Devices}},
issue = {{4}},
pages = {{1030-1036}},
note = {{Accessed on 2025/01/06}}}