TY  - JOUR

T1  - Common path michelson interferometer based on multiple reflections within the sample arm: Sensor applications and imaging artefacts

JO  - Measurement Science and Technology

PY  - 2011/01/01

AU  - Krstajić N

AU  - Childs D

AU  - Smallwood R

AU  - Hogg R

AU  - Matcher SJ

ED  - 

DO  - DOI: 10.1088/0957-0233/22/2/027002

VL  - 22

IS  - 2

Y2  - 2024/12/22

ER  -