TY - CONF T1 - Single Event Effects in Power MOSFETs and SRAMs Due to 3 MeV, 14 MeV and Fission Neutrons JO - IEEE Transactions on Nuclear Science UR - http://dx.doi.org/10.1109/tns.2011.2106142 PY - 2011/02/22 AU - Hands A AU - Morris P AU - Dyer C AU - Ryden K AU - Truscott P ED - DO - DOI: 10.1109/tns.2011.2106142 PB - Institute of Electrical and Electronics Engineers (IEEE) VL - 58 IS - 3 SP - 952 EP - 959 Y2 - 2025/01/07 ER -