TY - CONF
T1 - Single Event Effects in Power MOSFETs and SRAMs Due to 3 MeV, 14 MeV and Fission Neutrons
JO - IEEE Transactions on Nuclear Science
UR - http://dx.doi.org/10.1109/tns.2011.2106142
PY - 2011/02/22
AU - Hands A
AU - Morris P
AU - Dyer C
AU - Ryden K
AU - Truscott P
ED -
DO - DOI: 10.1109/tns.2011.2106142
PB - Institute of Electrical and Electronics Engineers (IEEE)
VL - 58
IS - 3
SP - 952
EP - 959
Y2 - 2025/01/07
ER -