TY - JOUR T1 - Carrier escape mechanisms from GaAs/AlxGa1-xAs multiple quantum wells in an electric field JO - Applied Physics Letters PY - 1993/01/01 AU - Fox AM AU - Ispasoiu RG AU - Foxon CT AU - Cunningham JE AU - Jan WY ED - DO - DOI: 10.1063/1.110272 VL - 63 IS - 21 SP - 2917 EP - 2919 Y2 - 2024/12/23 ER -