TY  - CONF

T1  - Linear optics with projective measurements for fun and profit

JO  - Noise and Information in Nanoelectronics, Sensors, and Standards

PY  - 2003/09/19

AU  - Kok P

AU  - Lee H

AU  - Williams CP

AU  - Dowling JP

ED  - 

DO  - DOI: 10.1117/12.502402

PB  - SPIE

Y2  - 2024/12/22

ER  -